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features ? 1.65v - 1.95v read/write high performance ? random access time ? 70 ns ? page mode read time ? 20 ns ? synchronous burst frequency ? 66 mhz ? configurable burst operation sector erase architecture ? eight 4k word sectors with individual write lockout ? one hundred twenty-seven 32k word main sectors with individual write lockout typical sector erase time: 32k word sectors ? 700 ms; 4k word sectors ? 200 ms four plane organization, permitting concurrent read in any of the three planes not being programmed/erased ? memory plane a: 25% of memory including eight 4k word sectors ? memory plane b: 25% of memory consisting of 32k word sectors ? memory plane c: 25% of memory consisting of 32k word sectors ? memory plane d: 25% of memory consisting of 32k word sectors suspend/resume feature for erase and program ? supports reading and programming data from any sector by suspending erase of a different sector ? supports reading any word by suspending programming of any other word low-power operation ?30 ma active ? 35 a standby vpp pin for write protection and accelerated program operations reset input for device initialization cbga package top or bottom boot block configuration available 128-bit protection register common flash interface (cfi) 1. description the at49sn6416(t) is a 1.8-volt 64-megabit flash memory. the memory is divided into multiple sectors and planes for erase operations. the device can be read or reprogrammed off a single 1.8v power supply, making it ideally suited for in-system programming. the device can be configur ed to operate in the asynchronous/page read (default mode) or burst read mode. the burst read mode is used to achieve a faster data rate than is possible in the asynchronous/page read mode. if the avd and the clk signals are both tied to gnd and the burst configuration register is configured to perform asynchronous reads, the device will behave like a standard asynchronous flash memory. in the page mode, the avd signal can be tied to gnd or can be pulsed low to latch the page address. in both cases the clk can be tied to gnd. the at49sn6416(t) is divided into four memory planes. a read operation can occur in any of the three planes which is not being programmed or erased. this con- current operation allows improved system performance by not requiring the system to wait for a program or erase operation to complete before a read is performed. to fur- ther increase the flexibility of the device, it contains an erase suspend and program suspend feature. this feature will put the erase or program on hold for any amount of 64-megabit (4m x 16) burst/page mode 1.8-volt flash memory at49sn6416 at49sn6416t 3464c?flash?2/05
2 3464c?flash?2/05 at49sn6416(t) time and let the user read data from or program data to any of the remaining sectors. there is no reason to suspend the erase or program operation if the data to be read is in another memory plane. the vpp pin provides data protection and faster programming times. when the v pp input is below 0.4v, the program and erase functions are inhibited. when v pp is at 0.9v or above, normal program and erase operations can be performed. with v pp at 10.0v, the program (dual- word program command) operation is accelerated. 2. pin configurations 2.1 56-ball cbga (top view) pin name pin function i/o0 - i/o15 data inputs/outputs a0 - a21 addresses ce chip enable oe output enable we write enable avd address latch enable clk clock reset reset wp write protect vpp write protection and power supply for accelerated program operations wait wait vccq output power supply nc no connect a b c d e f g 1 2345678 a11 a12 a13 a15 vccq vss i/o7 a8 a9 a10 a14 i/o15 i/o14 vss vss a20 a21 wait i/o6 i/013 i/o5 vcc clk avd a16 i/o4 i/o11 vcc vpp reset we i/o12 i/o2 i/o10 i/o3 a18 a17 a19 wp i/o1 i/o9 vccq a6 a5 a7 nc ce i/o0 i/o8 a4 a3 a2 a1 a0 oe vss
3 3464c?flash?2/05 at49sn6416(t) 3. device operation 3.1 command sequences when the device is first powered on, it will be in the read mode. command sequences are used to place the device in other operating modes such as program and erase. the command sequences are written by applying a low pulse on the we input with ce low and oe high or by applying a low-going pulse on the ce input with we low and oe high. prior to the low-going pulse on the ce or we signal, the address input may be latched by a low-to-high transition on the avd signal. if the avd is not pulsed low, the address will be latched on the first rising edge of the we or ce . valid data is latched on the rising edge of the we or the ce pulse, whichever occurs first. the addresses used in the command sequences are not affected by entering the command sequences. 3.2 burst configuration command the program burst configuration register command is used to program the burst configuration register. the burst configuration register determines several parameters that control the read operation of the device. bit b15 determines whether synchronous burst reads are enabled or asynchronous reads are enabled. since the page read operation is an asynchronous operation, bit b15 must be set for asynchronous reads to enable the page read feature. the rest of the bits in the burst configuration register are used only for the burst read mode. bits b13 - b11 of the burst configuration register determine the clock latency for the burst mode. the latency can be set to two, three, four, five or six cycles. the ?clock latency versus input clock frequency? table is shown on page 21 . the ?burst read waveform? as shown on page 32 illustrates a clock latency of four; the data is output from the device four clock cycles after the first valid clock edge following the high-to-low avd edge. the b10 bit of the configuration register determines the polarity of the wait signal. the b9 bit of the burst configuration register determines the number of clocks that data will be held valid (see figure 8-1 ). the hold data for 2 clock cycles read waveform is shown on page 32 . the clock latency is not affected by the value of the b9 bit. the b8 bit of the burst configurat ion register determines when t he wait signal will be asserted. when synchronous burst reads are enabled, a linea r burst sequence is selected by setting bit b7. bit b6 selects whether the burst starts and the data output will be relative to the falling edge or the rising edge of the clock. bits b2 - b0 of the burst configuration register determine whether a continuous or fixed-length burst will be used and also determine whether a four-, eight- or six- teen-word length will be used in the fixed-length m ode. all other bits in the burst configuration register should be programmed as shown on page 21 . the default state (after power-up or reset) of the burst configuration register is also shown on page 21 .
4 3464c?flash?2/05 at49sn6416(t) 3.3 asynchronous read there are two types of asynchronous reads ? avd pulsed and standard asynchronous reads. the avd pulsed read operation of the device is controlled by ce , oe , and avd inputs. the out- puts are put in the high-impedance state whenever ce or oe is high. this dual-line control gives designers flexibility in preventing bus contention. the data at the address location defined by a0 - a21 and captured by the avd signal will be read when ce and oe are low. the address location passes into the device when ce and avd are low; the address is latched on the low-to- high transition of avd . low input levels on the oe and ce pins allow the data to be driven out of the device. the access time is measur ed from stable address, falling edge of avd or falling edge of ce , whichever occurs last. during the avd pulsed read, the clk signal may be static high or static low. for standard asynchronous reads, the avd and clk signal should be tied to gnd. the asynchronous read diagrams are shown on page 29 . 3.4 page read the page read operation of the device is controlled by ce , oe , and avd inputs. the clk input is ignored during a page read operation and should be tied to gnd. the page size is four words. during a page read, the avd signal can transition low and then transition high, transition low and remain low, or can be tied to gnd. if a high to low transition on the avd signal occurs, as shown in page read cycle waveform 1, the page address is latched by the low-to-high transition of the avd signal. however, if the avd signal remains low after the high-to-low transition or if the avd signal is tied to gnd, as shown in page read cycle waveform 2, then the page address (deter- mined by a21 - a2) cannot change during a page read operation. the first word access of the page read is the same as the asynchronous read. the first word is read at an asynchronous speed of 70 ns. once the first word is read, toggling a0 and a1 will result in subsequent reads within the page being output at a speed of 20 ns. if the avd and the clk pins are both tied to gnd, the device will behave like a standard asyn chronous flash memory. the page read dia- grams are shown on page 30 . 3.5 synchronous reads synchronous reads are used to achieve a faster data rate than is possible in the asynchro- nous/page read mode. the device can be configured for continuous or fixed-length burst access. the burst read operation of the device is controlled by ce , oe , clk and avd inputs. the initial read location is determined as for the avd pulsed asynchronous read operation; it can be any memory location in the device. in the burst access, the address is latched on the first valid clock edge when avd is low or the rising edge of the avd signal, whichever occurs first. the clk input signal controls the flow of data from the device for a burst operation. after the clock latency cycles, the data at the next burst address location is read for each following clock cycle. figure 3-1. word boundary 4-word boundary 16-word boundary word d0 - d3 word d4 - d7 word d8 - d11 word d12 - d15 d0 d1 d2 d3 d4 d5 d6 d7 d8 d9 d10 d11 d12 d13 d14 d15
5 3464c?flash?2/05 at49sn6416(t) 3.6 continuous burst read during a continuous burst read, any number of addresses can be read from the memory. when operating in the linear burst read mode (b7 = 1) with the burst wrap bit (b3 = 1) set, the device may incur an output delay when the burst sequence crosses the first 16-word boundary in the memory (see figure 3-1 ). if the starting address is aligned with a 4-word boundary (d0, d4, d8 or d12), there is no delay. if the starting address is not aligned with a 4-word boundary, an out- put delay is incurred. the delay depends on the starting address (see table 3-1 ). the delay takes place only once, and only if the burst sequence crosses a 16-word boundary. to indicate that the device is not ready to continue the burst, the device will drive the wait pin low (b10 and b8 = 0) during the clock cycles in which new data is not being presented. once the wait pin is driven high (b10 and b8 = 0), the current data will be valid. the wait signal will be tri-stated when the ce or oe signal is high. in the ?burst read waveform? as shown on page 32 , the valid address is latched at point a. for the specified clock latency of four, data d11 is valid within 13 ns of clock edge b. the low-to-high transition of the clock at point c results in d12 being read. the transition of the clock at point d results in a burst read of d15. the clock transition at point e does not cause new data to appear on the output lines because the wait signal goes low (b10 and b8 = 0) after the clock transition, which signifies that the first boundary in the memory has been crossed and that new data is not available. the clock transition at point f does cause a burst read of data d16 because the wait signal goes high (b10 and b8 = 0) after the clock transition indicating that new data is available. additional clock transitions, like at point g, will continue to result in burst reads. 3.7 fixed-length burst reads during a fixed-length burst mode read, four, eight or sixteen words of data may be burst from the device, depending upon the configuration. the device supports a linear burst mode. the burst sequence is shown on page 22 . when operating in the linear burst read mode (b7 = 1) with the burst wrap bit (b3 = 1) set, the device may incur an output delay when the burst sequence crosses the first 16-word boundary in the memory. if the starting address is aligned with a 4-word boundary (d0, d4, d8 or d12), there is no delay. if the starting address is not aligned with a 4-word boundary an output delay is incurred. the delay depends on the starting address (see table 3-1 ). the delay takes place only once, and only if the burst sequence crosses a 16-word boundary. to indicate that the device is not ready to continue the burst, the device will drive the wait pin low (b10 and b8 = 0) during the clock cycles in which new data is not being presented. once the wait pin is driven high (b10 and b8 = 0), the current data will be valid. the wait signal will be tri-stated when the ce or oe signal is high. the ?four-word burst read waveform? on page 33 illustrates a fixed-length burst cycle. the valid address is latched at point a. for the specified clock latency of four, data d0 is valid within 13 ns of clock edge b. the low-to-high transition of the clock at point c results in d1 being read. similarly, d2 and d3 are output following the next two clock cycles. returning ce high ends the read cycle. there is no output delay in the burst access wrap mode (b3 = 0). table 3-1. output delay starting address output delay hold data for 1 clock cycle, b9 = 0 output delay hold data for 2 clock cycles, b9 = 1 d1, d5, d9, d13 1 clock cycle 2 clock cycle d2, d6, d10, d14 2 clock cycles 4 clock cycles d3, d7, d11, d15 3 clock cycles 6 clock cycles
6 3464c?flash?2/05 at49sn6416(t) 3.8 burst suspend the burst suspend feature allows the system to temporarily suspend a synchronous burst oper- ation if the system needs to use the flash address and data bus for other purposes. burst accesses can be suspended during the initial latency (before data is received) or after the device has output data. when a burst access is suspended, internal array sensing continues and any previously latched internal data is retained. burst suspend occurs when ce is asserted, the current address has been latched (either rising edge of avd or valid clk edge), clk is halted, and oe is deasserted. the clk can be halted when it is at v ih or v il . to resume the burst access, oe is reasserted and the clk is restarted. subsequent clk edges resume the burst sequence where it left off. within the device, oe gates the wait signal. therefore, during burst suspend the wait signal reverts to a high-impedance state when oe is deasserted. see ?burst suspend waveform? on page 33. 3.9 reset a reset input pin is provided to ease some system applications. when reset is at a logic high level, the device is in its standard operating mode. a low level on the reset pin halts the present device operation and puts the outputs of the device in a high-impedance state. when a high level is reasserted on the reset pin, the device returns to read mode. 3.10 erase before a word can be reprogrammed it must be erased. the erased state of the memory bits is a logical ?1?. the entire memory can be erased by using the chip erase command or individual planes can be erased by using the plane erase command or individual sectors can be erased by using the sector erase command. 3.10.1 chip erase chip erase is a two-bus cycle operation. the au tomatic erase begins on the rising edge of the last we pulse. chip erase does not alter the data of the protected sectors. the hardware reset during chip erase will stop the erase, but the data will be of an unknown state. 3.10.2 plane erase as an alternative to a full chip erase, the device is organized into four planes that can be individ- ually erased. the plane erase command is a two-bus cycle operation. the plane whose address is valid at the second rising edge of we will be erased. the plane erase command does not alter the data in the protected sectors. 3.10.3 sector erase the device is organized into multiple sectors that can be individually erased. the sector erase command is a two-bus cycle operation. the sector whose address is valid at the second rising edge of we will be erased provided the given sector has not been protected.
7 3464c?flash?2/05 at49sn6416(t) 3.11 word programming the device is programmed on a word-by-word basis. programming is accomplished via the internal device command register and is a two-bus cycle operation. the programming address and data are latched in the second cycle. the device will automatically generate the required internal programming pulses. please note that a ?0? cannot be programmed back to a ?1?; only erase operations can convert ?0?s to ?1?s. 3.12 flexible sector protection the at49sn6416(t) offers two sector protection modes, the softlock and the hardlock. the softlock mode is optimized as sector protection for sectors whose content changes frequently. the hardlock protection mode is recommended for sectors whose content changes infrequently. once either of these two modes is enabled, the contents of the selected sector is read-only and cannot be erased or programmed. each sector can be independently programmed for either the softlock or hardlock sector protection mode. at power-up and reset, all sectors have their soft- lock protection mode enabled. 3.12.1 softlock and unlock the softlock protection mode can be disabled by issuing a two-bus cycle unlock command to the selected sector. once a sector is unlocked, its contents can be erased or programmed. to enable the softlock protection mode, a two-bus cycle softlock command must be issued to the selected sector. 3.12.2 hardlock and write protect (wp ) the hardlock sector protection mode operates in conjunction with the write protection (wp ) pin. the hardlock sector protection mode can be enabled by issuing a two-bus cycle hardlock soft- ware command to the selected sector. the state of the write protect pin affects whether the hardlock protection mode can be overridden. when the wp pin is low and the hardlock protection mode is enabled, the sector cannot be unlocked and the contents of the sector is read-only. when the wp pin is high, the hardlock protection mode is overridden and the sector can be unlocked via the unlock command. to disable the hardlock sector protection mode, the chip must be either reset or power cycled.
8 3464c?flash?2/05 at49sn6416(t) figure 3-2. sector locking state diagram note: 1. the notation [x, y, z] denotes the locking state of a sector. the current locking state of a sector is defined by the state of wp and the two bits of the sector-lock status d[1:0]. table 3-2. hardlock and softlock protection configurations in conjunction with wp v pp wp hard- lock soft- lock erase/ prog allowed? comments v cc 0 0 0 yes no sector is locked v cc 00 1 no sector is softlocked. the unlock command can unlock the sector. v cc 01 1 no hardlock protection mode is enabled. the sector cannot be unlocked. v cc 1 0 0 yes no sector is locked. v cc 10 1 no sector is softlocked. the unlock command can unlock the sector. v cc 11 0 yes hardlock protection mode is overridden and the sector is not locked. v cc 11 1 no hardlock protection mode is overridden and the sector can be unlocked via the unlock command. v il xx x no erase and program operations cannot be performed. [000] [001] [011] [111] [101] [110] [100] 60h/ d0h 60h/01h 60h/ 2fh 6 0 h / 2 f h 60h/d0h 60h/ 01h 60h/ d0h 60h/ 01h 60h/ 2fh 60h/ 2fh unlocked locked wp = v il =0 wp = v ih =1 power-up/reset default power-up/reset default hardlocked is disabled by wp = v ih 60h/d0h = unlock command 60h/01h = softlock command 60h/2fh = hardlock command hardlocked
9 3464c?flash?2/05 at49sn6416(t) 3.12.3 sector protection detection a software method is available to determine if the sector protection softlock or hardlock features are enabled. when the device is in the software product identification mode a read from the i/o0 and i/o1 at address location 00002h within a sector will show if the sector is unlocked, soft- locked, or hardlocked. 3.13 read status register the status register indicates the status of device operations and the success/failure of that oper- ation. the read status register command causes subsequent reads to output data from the status register until another command is issued. to return to reading from the memory, issue a read command. the status register bits are output on i/o7 - i/o0. the upper byte, i/o15 - i/o8, outputs 00h when a read status register command is issued. the contents of the status register [sr7:sr0] are latched on the falling edge of oe or ce (whichever occurs last), which prevents possible bus errors that might occur if status register contents change while being read. ce or oe must be toggled with each subsequent status read, or the status register will not indicate completion of a program or erase operation. when the write state machine (wsm) is active, sr7 will indicate the status of the wsm; the remaining bits in the status register indicate whether the wsm was successful in performing the preferred operation (see table 3-4 ). table 3-3. sector protection status i/o1 i/o0 sector protection status 0 0 sector not locked 0 1 softlock enabled 1 0 hardlock enabled 1 1 both hardlock and softlock enabled
10 3464c?flash?2/05 at49sn6416(t) 3.14 read status register in the burst mode the waveform below shows a status register read during a program operation. the two-bus cycle command for a program operation is given followed by a read status register command. following the read status register command, the avd signal is pulsed low to latch the valid address at point a. with the oe signal pulsed low and for the specified clock latency of three, the status register output is valid within 13 ns fr om clock edge b. the same status register data is output on successive clock edges. to update the status register output, the avd signal needs to be pulsed low and the next data is available after a clock latency of three. the status register output is also available after the chosen clock latency during an erase operation. figure 3-3. read status register in the burst mode note: 1. the wait signal is for a burst configuration setting of b10 and b8 = 0. xx 40h/10h data 70h 00h 80h address ce a0 - a21 i/o0 - i/o15 avd clk oe we wait (1) b a
11 3464c?flash?2/05 at49sn6416(t) note: 1. a command sequence error is indicated when sr1, sr3, sr4 and sr5 are set. table 3-4. status register bit definition wsms ess es prs vpps pss sls pls 76543210 notes sr7 write state machine status (wsms) 1 = ready 0 = busy check write state machine bit first to determine word program or sector erase completion, before checking program or erase status bits. sr6 = erase suspend status (ess) 1 = erase suspended 0 = erase in progress/completed when erase suspend is issued, wsm halts execution and sets both wsms and ess bits to ?1? ? ess bit remains set to ?1? until an erase resume command is issued. sr5 = erase status (es) 1 = error in sector erase 0 = successful sector erase when this bit is set to ?1?, wsm has applied the max number of erase pulses to the sector and is still unable to verify successful sector erasure. sr4 = program status (prs) 1 = error in programming 0 = successful programming when this bit is set to ?1?, wsm has attempted but failed to program a word sr3 = vpp status (vpps) 1 = vpp low detect, operation abort 0 = vpp ok the v pp status bit does not provide continuous indication of vpp level. the wsm interrogates v pp level only after the program or erase command sequences have been entered and informs the system if v pp has not been switched on. the v pp is also checked before the operation is verified by the wsm. sr2 = program suspend status (pss) 1 = program suspended 0 = program in progress/completed when program suspend is issued, wsm halts execution and sets both wsms and pss bits to ?1?. pss bit remains set to ?1? until a program resume command is issued. sr1 = sector lock status 1 = prog/erase attempted on a locked sector; operation aborted. 0 = no operation to locked sectors if a program or erase operation is attempted to one of the locked sectors, this bit is set by the wsm. the operation specified is aborted and the device is returned to read status mode. sr0 = plane status (pls) indicates program or erase status of the addressed plane. table 3-5. status register device wsms and write status definition wsms (sr7) pls (sr0) description 0 0 the addressed plane is performing a program/erase operation. 0 1 a plane other than the one currently addressed is performing a program/erase operation. 1x no program/erase operation is in progress in any plane. erase and program suspend bits (sr6, sr2) indicate whether other planes are suspended.
12 3464c?flash?2/05 at49sn6416(t) 3.15 erase suspend/erase resume the erase suspend command allows the system to interrupt a sector erase or plane erase oper- ation. the erase suspend command does not work with the chip erase feature. using the erase suspend command to suspend a sector erase operation, the system can program or read data from a different sector within the same plane. since this device is organized into four planes, there is no need to use the erase suspend feature while erasing a sector when you want to read data from a sector in another plane. after the erase suspend command is given, the device requires a maximum time of 15 s to suspend the erase operation. after the erase operation has been suspended, the plane that contains the suspended sector enters the erase-suspend-read mode. the system can then read data or program data to any other sector within the device. an address is not required during the erase suspend command. during a sector erase suspend, another sector cannot be erased. to resume the sector erase operation, the system must write the erase resume command. the erase resume command is a one-bus cycle command, which does require the plane address. read, read status register, product id entry, clear sta- tus register, program, program suspend, erase resume, sector softlock/hardlock, sector unlock are valid commands during an erase suspend. 3.16 program suspend/program resume the program suspend command allows the system to interrupt a programming operation and then read data from a different word within the memory. after the program suspend command is given, the device requires a maximum of 10 s to suspend the programming operation. after the programming operation has been suspended, the system can then read from any other word within the device. an address is not required during the program suspend operation. to resume the programming operation, the system must write the program resume command. the pro- gram suspend and resume are one-bus cycle commands. the command sequence for the erase suspend and program suspend are the same, and the command sequence for the erase resume and program resume are the same. read, read status register, product id entry, pro- gram resume are valid commands during a program suspend. 3.17 128-bit protection register the at49sn6416(t) contains a 128-bit register t hat can be used for security purposes in sys- tem design. the protection register is divided into two 64-bit blocks. the two blocks are designated as block a and block b. the data in block a is non-changeable and is programmed at the factory with a unique number. the data in block b is programmed by the user and can be locked out such that data in the block cannot be reprogrammed. to program block b in the pro- tection register, the two-bus cycle program protection register command must be used as shown in the ?command definition table? on page 19 . to lock out block b, the two-bus cycle lock protection register command must be used as shown in the ?command definition table? . data bit d1 must be zero during the second bus cycle. all other data bits during the second bus cycle are don?t cares. to determine whether block b is locked out, the status of sector b com- mand is given. if data bit d1 is zero, block b is locked. if data bit d1 is one, block b can be reprogrammed. please see the ?protection register addressing table? on page 20 for the address locations in the protection register. to read the protection register, the product id entry command is given followed by a normal read operation from an address within the protection register. after determining whether block b is protected or not or reading the protection register, the read command must be given to return to the read mode.
13 3464c?flash?2/05 at49sn6416(t) 3.18 common flash interface (cfi) cfi is a published, standardized data structure that may be read from a flash device. cfi allows system software to query the installed device to determine the configurations, various electrical and timing parameters, and functions supported by the device. cfi is used to allow the system to learn how to interface to the flash device most optimally. the two primary benefits of using cfi are ease of upgrading and second source availability. the command to enter the cfi query mode is a one-bus cycle command which requires writing data 98h to any address. the cfi query command can be written when the device is ready to read data or can also be written when the part is in the product id mode. once in the cfi query mode, the system can read cfi data at the addresses given in ?common flash interface definition table? on page 37 . to return to the read mode, the read command should be issued. 3.19 hardware data protection hardware features protect against inadvertent programs to the at49sn6416(t) in the following ways: (a) v cc sense: if v cc is below 1.2v (typical), the device is reset and the program and erase functions are inhibited. (b) v cc power-on delay: once v cc has reached the v cc sense level, the device will automatically time-out 10 ms (typical) before programming. (c) program inhibit: holding any one of oe low, ce high or we high inhibits program cycles. (d) noise filter: pulses of less than 15 ns (typical) on the we or ce inputs will not initiate a program cycle. (e) v pp is less than v ilpp . 3.20 input levels while operating with a 1.65v to 1.95v power supply, the address inputs and control inputs (oe , ce and we ) may be driven from 0 to 2.5v without adversely affecting the operation of the device. the i/o lines can be driven from 0 to v ccq + 0.6v. 3.21 output levels for the at49sn6416(t), output high levels are equal to v ccq - 0.1v (not v cc ). v ccq must be regulated between 1.65v - 2.25v.
14 3464c?flash?2/05 at49sn6416(t) 3.22 word program flowchart pr ogram suspend loop start wr ite 40, wor d addr ess wr ite d ata, wor d addr ess read status register sr 7 = full status check (if desired) progr am complete suspend? 1 0 no yes (s etup) (confirm) 3.23 word program procedure bus operation command comments write program setup data = 40 addr = location to program write data data = data to program addr = location to program read none status register data: toggle ce or oe to update status register idle none check sr7 1 = wsm ready 0 = wsm busy repeat for subsequent word program operations. full status register check can be done after each program, or after a sequence of program operations. write ff after the last operation to set to the read state. 3.24 full status check flowchart read status register progr am successful sr3 = sr1 = 0 0 sr4 = 0 1 1 1 v pp range error device pr otect err or progr am error 3.25 full status check procedure bus operation command comments idle none check sr3: 1 = v pp error idle none check sr4: 1 = data program error idle none check sr1: 1 = sector locked; operation aborted sr3 must be cleared before the write state machine allows further program attempts. if an error is detected, clear the status register before continuing operations ? only the clear status register command clears the status register error bits.
15 3464c?flash?2/05 at49sn6416(t) 3.26 program suspend/resume flowchart r ead status register sr7 = sr2 = read data program completed done reading program resumed read data 0 no 0 yes 1 1 wr ite ff (read array) wr ite d 0 any address (program resume) wr ite ff (read array) start wr ite b0 any address (program suspend) wr ite 70 any address (read status) the same plane within suspend plane write 70h any address within the same plane (read status) 3.27 program suspend/resume procedure bus operation command comments write program suspend data = b0 addr = sector address to suspend (sa) write read status data = 70 addr = any address within the same plane read none status register data: toggle ce or oe to update status register addr = any address idle none check sr7 1 = wsm ready 0 = wsm busy idle none check sr2 1 = program suspended 0 = program completed write read array data = ff addr = any address within the suspended plane read none read data from any sector in the memory other than the one being programmed write program resume data = d0 addr = any address if the suspend plane was placed in read mode: write read status return plane to status mode: data = 70 addr = any address within the same plane
16 3464c?flash?2/05 at49sn6416(t) 3.28 erase suspend/resume flowchart erase completed read array data 0 0 1 1 start read status r egister sr7 = sr6 = er ase resumed done? r ead read or program? wr ite 70, any addr ess (read status) wr ite b 0, any addr ess (erase suspend) wr ite d 0, any addr ess (e rase re sum e) wri te ff (read a rray) no yes program loop write 70h any address within the same plane (read status) 3.29 erase suspend/resume procedure bus operation command comments write erase suspend data = b0 addr = any address within the same plane write read status data = 70 addr = any address read none status register data: toggle ce or oe to update status register addr = any address within the same plane idle none check sr7 1 = wsm ready 0 = wsm busy idle none check sr6 1 = erase suspended 0 = erase completed write read or program data = ff or 40 addr = any address read or write none read or program data from/to sector other than the one being erased write program resume data = d0 addr = any address if the suspended plane was placed in read mode or a program loop: write read status return plane to status mode: data = 70 addr = any address within the same plane
17 3464c?flash?2/05 at49sn6416(t) 3.30 sector erase flowchart start no suspend erase 1 0 yes suspend erase loop write 2 0, addr ess write d0, addr ess read status r egister sr7 = full erase status check (if desired) erase complete (erase) (erase confirm) sector sector sector sector 3.31 sector erase procedure bus operation command comments write sector erase setup data = 20 addr = sector to be erased (sa) write erase confirm data = d0 addr = sector to be erased (sa) read none status register data: toggle ce or oe to update status register data idle none check sr7 1 = wsms ready 0 = wsms busy repeat for subsequent sector erasures. full status register check can be done after each sector erase, or after a sequence of sector erasures. write ff after the last operation to enter read mode. 3.32 full erase status check flowchart 0 0 0 1 1,1 1 1 0 read status r egister erase successful sr1 = sector sector locked error sr3 = v pp range error sr4, sr5 = command sequence er r or sr5 = erase error sector 3.33 full erase status check procedure bus operation command comments idle none check sr3: 1 = v pp range error idle none check sr4, sr5: both 1 = command sequence error idle none check sr5: 1 = sector erase error idle none check sr1: 1 = attempted erase of locked sector; erase aborted. sr1, sr3 must be cleared before the write state machine allows further erase attempts. only the clear status register command clears sr1, sr3, sr4, sr5. if an error is detected, clear the status register before attempting an erase retry or other error recovery.
18 3464c?flash?2/05 at49sn6416(t) 3.34 protection register programming flowchart 1 0 start write c0, pr address write pr address & data read status register sr7 = full status check (if desir ed) pr ogram complete (program setup) (confirm data) 3.35 protection register programming procedure bus operation command comments write program pr setup data = c0 addr = first location to program write protection program data = data to program addr = location to program read none status register data: toggle ce or oe to update status register data idle none check sr7 1 = wsms ready 0 = wsms busy program protection register operation addresses must be within the protection register address space. addresses outside this space will return an error. repeat for subsequent programming operations. full status register check can be done after each program, or after a sequence of program operations. write ff after the last operation to return to the read mode. 3.36 full status check flowchart 0, 1 1, 1 read status register data pr ogram successful = v pp range error program er ror register locked; program aborted 0 0 sr1, sr4 sr1, sr4 sr3, sr4 = 0 = 1, 1 3.37 full status check procedure bus operation command comments idle none check sr1, sr3, sr4: 0,1,1 = v pp range error idle none check sr1, sr3, sr4: 0,0,1 = programming error idle none check sr1, sr3, sr4: 1, 0,1 = sector locked; operation aborted sr3 must be cleared before the write state machine allows further program attempts. only the clear status register command clears sr1, sr3, sr4. if an error is detected, clear the status register before attempting a program retry or other error recovery.
19 3464c?flash?2/05 at49sn6416(t) notes: 1. the data format shown for each bus cycle is as fo llows; i/o7 - i/o0 (hex). i/o15 - i/o8 are don?t care. the address format shown for each bus cycle is as follows: a7 - a0 (hex). address a21 through a8 are don?t care. 2. pa is the plane address (a21 - a20). any address within a plane can be used. 3. sa = sector address. any word address within a sector can be used to designate the sector address (see pages 23 - 26 for details). 4. the first bus cycle address should be the same as the word address to be programmed. 5. the status register bits are output on i/o7 - i/o0. 6. if data bit d1 is ?0?, sector b is locked. if data bit d1 is ?1?, sector b can be reprogrammed. 7. see ?burst configuration register table? on page 21 . bits b15 - b0 of the burst configuration register determine a15 - a0. addresses a16 - a21 can select any plane. 8. for the at49sn6416: for the at49sn6416t: xxx = 000005 burst configuration register data from plane a xxx = 000005 burst configuration register data from plane d xxx = 100005 burst configuration register data from plane b xxx = 100005 burst configuration register data from plane c xxx = 200005 burst configuration register data from plane c xxx = 200005 burst configuration register data from plane b xxx = 300005 burst configuration register data from plane d xxx = 300005 burst configuration register data from plane a 9. any address within the user programmable protection register region. please see ?protection register addressing table? on page 20 . 10. this fast programming option enables the user to program two words in parallel only when v pp = 10v. the addresses, addr0 and addr1, of the two words, d in0 and d in1 , must only differ in address a0. this command should be used during manufac- turing purposes only. 11. during the second bus sycle, the manufacturer code is read from address pa+00000h, the device code is read from address pa+00001h, and the data in the protection register is read from addresses 000081h - 000088h (at49sn6416) or addresses 3f8081h - 3f8088h (at49sn6416t). 12. the plane address should be the same during the first and second bus cycle. 13. for the at49sn6416, xxxx = 0000h. for the at49sn6416t, xxxx = 3f80h. 4. command definition table command sequence bus cycles 1st bus cycle 2nd bus cycle 3rd bus cycle addr data addr data addr data read 1 pa (2) ff chip erase 2 xx 21 addr d0 plane erase 2 xx 22 addr d0 sector erase 2 sa (3) 20 sa (3) d0 word program 2 addr (4) 40/10 addr (4) d in dual word program (10) 3 addr0 e0 addr0 d in0 addr1 d in1 erase/program suspend 1 xx b0 erase/program resume 1 pa (2) d0 product id entry (11)(12) 1pa (2) 90 sector softlock 2 sa (3) 60 sa (3) 01 sector hardlock 2 sa (3) 60 sa (3) 2f sector unlock 2 sa (3) 60 sa (3) d0 read status register 2 pa (2) 70 xx d out (5) clear status register 1 xx 50 program protection register 2 xx (9) c0 xx (9) d in lock protection register ? sector b 2 xxxx 80 (13) c0 xxxx 80 (13) fffd status of sector b protection 2 xxxx 80 (13) 90 xxxx 80 (13) d out (6) program burst configuration register 2 addr (7) 60 addr (7) 03 read burst configuration register 2 pa (2) 90 xxx (8) d out cfi query 1 xx 98
20 3464c?flash?2/05 at49sn6416(t) notes: 1. for the at49sn6416, all address lines not specified in the above table, a21 - a8, must be 0 when accessing the protecti on register. 2. for the at49sn6416t, all address lines not specified in the above table, a21 - a8, must be 3f80h when accessing the protection register. 5. absolute maximum ratings* temperature under bias ................................ -55c to +125c *notice: stresses beyond those listed under ?absolute maximum ratings? may cause permanent dam- age to the device. this is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect device reliability. storage temperature ..................................... -65c to +150c all input voltages except v pp (including nc pins) with respect to ground ...................................-0.6v to +6.25v v pp input voltage with respect to ground ......................................... 0v to 10.0v all output voltages with respect to ground ...........................-0.6v to v ccq + 0.6v 6. protection register addressing table word use block a7 a6 a5 a4 a3 a2 a1 a0 0factorya10000001 1factorya10000010 2factorya10000011 3factorya10000100 4userb10000101 5userb10000110 6userb10000111 7userb10001000
21 3464c?flash?2/05 at49sn6416(t) notes: 1. default state 2. burst configuration setting of b13 - b11 = 010 (clock latency of two), b9 = 1 (hold data for two clock cycles) and b8 = 1 (wait asserted one clock cycle before data is valid) is not supported. 3. data is not ready when wait is asserted. figure 8-1. output configuration 7. burst configuration register table b15 program (at49sn6416) 0 1 (1) synchronous burst reads enabled asynchronous burstreads enabled b15 program (at49sn6416t) 1 0 (1) synchronous burst reads enabled asynchronous burstreads enabled b15 read 0 1 synchronous burst reads enabled asynchronous burstreads enabled b14 reserved for future use b13 - b11: (2) 010 011 100 101 110 (1) clock latency of two clock latency of three clock latency of four clock latency of five clock latency of six b10 0 1 (1)(3) wait signal is asserted low wait signal is asserted high b9 0 1 (1) hold data for one clock hold data for two clocks b8 0 1 (1) wait asserted during clock cycle in which data is valid wait asserted one clock cycle before data is valid b7 1 (1) linear burst sequence b6 0 1 (1) burst starts and data output on falling clock edge burst starts and data output on rising clock edge b5 - b4 00 (1) reserved for future use b3 0 1 (1) reserved for future use don?t wrap accesses within burst length set by b2 - b0 b2 - b0 001 010 011 111 (1) four-word burst eight-word burst sixteen-word burst continuous burst 8. clock latency versus input clock frequency minimum clock latency (minimum number of clocks following address latch) input clock frequency 5, 6 66 mhz 4 61 mhz 2, 3 40 mhz valid output valid output valid output valid output valid output clk i/00 - i/015 i/00 - i/015 1 clk data hold (b9 = 0) 2 clk data hold (b9 = 1)
22 3464c?flash?2/05 at49sn6416(t) 9. sequence and burst length start addr. (decimal) wrap b3 = 1 burst addressing sequence (decimal) 4-word burst length b2 ? b0 = 001 8-word burst length b2 ? b0 = 010 16-word burst length b2 ? b0 = 011 continuous burst b2 ? b0 = 111 linear linear linear linear 0 1 0-1-2-3 0-1-2-3-4-5-6-7 0- 1-2...14-15 0-1-2-3-4-5-6... 1 1 1-2-3-4 1-2-3-4-5-6-7-8 1- 2-3...15-16 1-2-3-4-5-6-7... 2 1 2-3-4-5 2-3-4-5-6-7-8-9 2- 3-4...16-17 2-3-4-5-6-7-8... 3 1 3-4-5-6 3-4-5-6-7-8-9-10 3-4-5...17-18 3-4-5-6-7-8-9... 4 1 4-5-6-7-8-9-10- 11 4-5-6...18-19 4- 5-6-7-8-9-10... 5 1 5-6-7-8-9-10-11- 12 5-6-7...19-20 5- 6-7-8-9-10-11... 6 1 6-7-8-9-10-11-12- 13 6-7-8...20-21 6- 7-8-9-10-11-12... 7 1 7-8-9-10-11-12-13- 14 7-8-9...21-22 7- 8-9-10-11-12-13... ... ... ... ... ... ... 14 1 14-15...28-29 14-15-16-17-18-19-20 15 1 15-16...29-30 15-16-17-18-19-20-21
23 3464c?flash?2/05 at49sn6416(t) 10. memory organization ? at49sn6416 plane sector size (words) x16 address range (a21 - a0) a sa0 4k 00000 - 00fff a sa1 4k 01000 - 01fff a sa2 4k 02000 - 02fff a sa3 4k 03000 - 03fff a sa4 4k 04000 - 04fff a sa5 4k 05000 - 05fff a sa6 4k 06000 - 06fff a sa7 4k 07000 - 07fff a sa8 32k 08000 - 0ffff a sa9 32k 10000 - 17fff a sa10 32k 18000 - 1ffff a sa11 32k 20000 - 27fff a sa12 32k 28000 - 2ffff a sa13 32k 30000 - 37fff a sa14 32k 38000 - 3ffff a sa15 32k 40000 - 47fff a sa16 32k 48000 - 4ffff a sa17 32k 50000 - 57fff a sa18 32k 58000 - 5ffff a sa19 32k 60000 - 67fff a sa20 32k 68000 - 6ffff a sa21 32k 70000 - 77fff a sa22 32k 78000 - 7ffff a sa23 32k 80000 - 87fff a sa24 32k 88000 - 8ffff a sa25 32k 90000 - 97fff a sa26 32k 98000 - 9ffff a sa27 32k a0000 - a7fff a sa28 32k a8000 - affff a sa29 32k b0000 - b7fff a sa30 32k b8000 - bffff a sa31 32k c0000 - c7fff a sa32 32k c8000 - cffff a sa33 32k d0000 - d7fff a sa34 32k d8000 - dffff a sa35 32k e0000 - e7fff a sa36 32k e8000 - effff a sa37 32k f0000 - f7fff a sa38 32k f8000 - fffff b sa39 32k 100000 - 107fff b sa40 32k 108000 - 10ffff b sa41 32k 110000 - 117fff b sa42 32k 118000 - 11ffff b sa43 32k 120000 - 127fff b sa44 32k 128000 - 12ffff b sa45 32k 130000 - 137fff b sa46 32k 138000 - 13ffff b sa47 32k 140000 - 147fff b sa48 32k 148000 - 14ffff b sa49 32k 150000 - 157fff b sa50 32k 158000 - 15ffff b sa51 32k 160000 - 167fff b sa52 32k 168000 - 16ffff b sa53 32k 170000 - 177fff b sa54 32k 178000 - 17ffff b sa55 32k 180000 - 187fff b sa56 32k 188000 - 18ffff b sa57 32k 190000 - 197fff b sa58 32k 198000 - 19ffff b sa59 32k 1a0000 - 1a7fff b sa60 32k 1a8000 - 1affff b sa61 32k 1b0000 - 1b7fff b sa62 32k 1b8000 - 1bffff b sa63 32k 1c0000 - 1c7fff b sa64 32k 1c8000 - 1cffff b sa65 32k 1d0000 - 1d7fff b sa66 32k 1d8000 - 1dffff b sa67 32k 1e0000 - 1e7fff b sa68 32k 1e8000 - 1effff b sa69 32k 1f0000 - 1f7fff b sa70 32k 1f8000 - 1fffff c sa71 32k 200000 - 207fff 10. memory organization ? at49sn6416 (continued) plane sector size (words) x16 address range (a21 - a0)
24 3464c?flash?2/05 at49sn6416(t) c sa72 32k 208000 - 20ffff c sa73 32k 210000 - 217fff c sa74 32k 218000 - 21ffff c sa75 32k 220000 - 227fff c sa76 32k 228000 - 22ffff c sa77 32k 230000 - 237fff c sa78 32k 238000 - 23ffff c sa79 32k 240000 - 247fff c sa80 32k 248000 - 24ffff c sa81 32k 250000 - 257fff c sa82 32k 258000 - 25ffff c sa83 32k 260000 - 267fff c sa84 32k 268000 - 26ffff c sa85 32k 270000 - 277fff c sa86 32k 278000 - 27ffff c sa87 32k 280000 - 287fff c sa88 32k 288000 - 28ffff c sa89 32k 290000 - 297fff c sa90 32k 298000 - 29ffff c sa91 32k 2a0000 - 2a7fff c sa92 32k 2a8000 - 2affff c sa93 32k 2b0000 - 2b7fff c sa94 32k 2b8000 - 2bffff c sa95 32k 2c0000 - 2c7fff c sa96 32k 2c8000 - 2cffff c sa97 32k 2d0000 - 2d7fff c sa98 32k 2d8000 - 2dffff c sa99 32k 2e0000 - 2e7fff c sa100 32k 2e8000 - 2effff c sa101 32k 2f0000 - 2f7fff c sa102 32k 2f8000 - 2fffff 10. memory organization ? at49sn6416 (continued) plane sector size (words) x16 address range (a21 - a0) d sa103 32k 300000 - 307fff d sa104 32k 308000 - 30ffff d sa105 32k 310000 - 317fff d sa106 32k 318000 - 31ffff d sa107 32k 320000 - 327fff d sa108 32k 328000 - 32ffff d sa109 32k 330000 - 337fff d sa110 32k 338000 - 33ffff d sa111 32k 340000 - 347fff d sa112 32k 348000 - 34ffff d sa113 32k 350000 - 357fff d sa114 32k 358000 - 35ffff d sa115 32k 360000 - 367fff d sa116 32k 368000 - 36ffff d sa117 32k 370000 - 377fff d sa118 32k 378000 - 37ffff d sa119 32k 380000 - 387fff d sa120 32k 388000 - 38ffff d sa121 32k 390000 - 397fff d sa122 32k 398000 - 39ffff d sa123 32k 3a0000 - 3a7fff d sa124 32k 3a8000 - 3affff d sa125 32k 3b0000 - 3b7fff d sa126 32k 3b8000 - 3bffff d sa127 32k 3c0000 - 3c7fff d sa128 32k 3c8000 - 3cffff d sa129 32k 3d0000 - 3d7fff d sa130 32k 3d8000 - 3dffff d sa131 32k 3e0000 - 3e7fff d sa132 32k 3e8000 - 3effff d sa133 32k 3f0000 - 3f7fff d sa134 32k 3f8000 - 3fffff 10. memory organization ? at49sn6416 (continued) plane sector size (words) x16 address range (a21 - a0)
25 3464c?flash?2/05 at49sn6416(t) 11. memory organization ? at49sn6416t plane sector size (words) x16 address range (a21 - a0) d sa0 32k 00000 - 07fff d sa1 32k 08000 - 0ffff d sa2 32k 10000 - 17fff d sa3 32k 18000 - 1ffff d sa4 32k 20000 - 27fff d sa5 32k 28000 - 2ffff d sa6 32k 30000 - 37fff d sa7 32k 38000 - 3ffff d sa8 32k 40000 - 47fff d sa9 32k 48000 - 4ffff d sa10 32k 50000 - 57fff d sa11 32k 58000 - 5ffff d sa12 32k 60000 - 67fff d sa13 32k 68000 - 6ffff d sa14 32k 70000 - 77fff d sa15 32k 78000 - 7ffff d sa16 32k 80000 - 87fff d sa17 32k 88000 - 8ffff d sa18 32k 90000 - 97fff d sa19 32k 98000 - 9ffff d sa20 32k a0000 - a7fff d sa21 32k a8000 - affff d sa22 32k b0000 - b7fff d sa23 32k b8000 - bffff d sa24 32k c0000 - c7fff d sa25 32k c8000 - cffff d sa26 32k d0000 - d7fff d sa27 32k d8000 - dffff d sa28 32k e0000 - e7fff d sa29 32k e8000 - effff d sa30 32k f0000 - f7fff d sa31 32k f8000 - fffff c sa32 32k 100000 - 107fff c sa33 32k 108000 - 10ffff c sa34 32k 110000 - 117fff c sa35 32k 118000 - 11ffff c sa36 32k 120000 - 127fff c sa37 32k 128000 - 12ffff c sa38 32k 130000 - 137fff c sa39 32k 138000 - 13ffff c sa40 32k 140000 - 147fff c sa41 32k 148000 - 14ffff c sa42 32k 150000 - 157fff c sa43 32k 158000 - 15ffff c sa44 32k 160000 - 167fff c sa45 32k 168000 - 16ffff c sa46 32k 170000 - 177fff c sa47 32k 178000 - 17ffff c sa48 32k 180000 - 187fff c sa49 32k 188000 - 18ffff c sa50 32k 190000 - 197fff c sa51 32k 198000 - 19ffff c sa52 32k 1a0000 - 1a7fff c sa53 32k 1a8000 - 1affff c sa54 32k 1b0000 - 1b7fff c sa55 32k 1b8000 - 1bffff c sa56 32k 1c0000 - 1c7fff c sa57 32k 1c8000 - 1cffff c sa58 32k 1d0000 - 1d7fff c sa59 32k 1d8000 - 1dffff c sa60 32k 1e0000 - 1e7fff c sa61 32k 1e8000 - 1effff c sa62 32k 1f0000 - 1f7fff c sa63 32k 1f8000 - 1fffff b sa64 32k 200000 - 207fff b sa65 32k 208000 - 20ffff b sa66 32k 210000 - 217fff b sa67 32k 218000 - 21ffff b sa68 32k 220000 - 227fff b sa69 32k 228000 - 22ffff b sa70 32k 230000 - 237fff b sa71 32k 238000 - 23ffff 11. memory organization ? at49sn6416t (continued) plane sector size (words) x16 address range (a21 - a0)
26 3464c?flash?2/05 at49sn6416(t) b sa72 32k 240000 - 247fff b sa73 32k 248000 - 24ffff b sa74 32k 250000 - 257fff b sa75 32k 258000 - 25ffff b sa76 32k 260000 - 267fff b sa77 32k 268000 - 26ffff b sa78 32k 270000 - 277fff b sa79 32k 278000 - 27ffff b sa80 32k 280000 - 287fff b sa81 32k 288000 - 28ffff b sa82 32k 290000 - 297fff b sa83 32k 298000 -29ffff b sa84 32k 2a0000 - 2a7fff b sa85 32k 2a8000 - 2affff b sa86 32k 2b0000 - 2b7fff b sa87 32k 2b8000 - 2bffff b sa88 32k 2c0000 - 2c7fff b sa89 32k 2c8000 - 2cffff b sa90 32k 2d0000 - 2d7fff b sa91 32k 2d8000 - 2dffff b sa92 32k 2e0000 - 2e7fff b sa93 32k 2e8000 - 2effff b sa94 32k 2f0000 - 2f7fff b sa95 32k 2f8000 - 2fffff a sa96 32k 300000 - 307fff a sa97 32k 308000 - 30ffff a sa98 32k 310000 - 317fff a sa99 32k 318000 - 31ffff a sa100 32k 320000 - 327fff a sa101 32k 328000 - 32ffff a sa102 32k 330000 - 337fff a sa103 32k 338000 - 33ffff a sa104 32k 340000 - 347fff 11. memory organization ? at49sn6416t (continued) plane sector size (words) x16 address range (a21 - a0) a sa105 32k 348000 - 34ffff a sa106 32k 350000 - 357fff a sa107 32k 358000 - 35ffff a sa108 32k 360000 - 367fff a sa109 32k 368000 - 36ffff a sa110 32k 370000 - 377fff a sa111 32k 378000 - 37ffff a sa112 32k 380000 - 387fff a sa113 32k 388000 - 38ffff a sa114 32k 390000 - 397fff a sa115 32k 398000 - 39ffff a sa116 32k 3a0000 - 3a7fff a sa117 32k 3a8000 - 3affff a sa118 32k 3b0000 - 3b7fff a sa119 32k 3b8000 - 3bffff a sa120 32k 3c0000 - 3c7fff a sa121 32k 3c8000 - 3cffff a sa122 32k 3d0000 - 3d7fff a sa123 32k 3d8000 - 3dffff a sa124 32k 3e0000 - 3e7fff a sa125 32k 3e8000 - 3effff a sa126 32k 3f0000 - 3f7fff a sa127 4k 3f8000 - 3f8fff a sa128 4k 3f9000 - 3f9fff a sa129 4k 3fa000 - 3fafff a sa130 4k 3fb000 - 3fbfff a sa131 4k 3fc000 - 3fcfff a sa132 4k 3fd000 - 3fdfff a sa133 4k 3fe000 - 3fefff a sa134 4k 3ff000 - 3fffff 11. memory organization ? at49sn6416t (continued) plane sector size (words) x16 address range (a21 - a0)
27 3464c?flash?2/05 at49sn6416(t) notes: 1. x can be vil or vih. 2. refer to ac programming waveforms. 3. manufacturer code: 001fh; device code: 00de - at49sn6416; 00d8h - at49sn6416t. 4. the vpp pin can be tied to v cc . for faster program operations, v pp can be set to 9.5v 0.5v. 5. v ihpp (min) = 0.9v. 6. v ilpp (max) = 0.4v. 12. dc and ac operating range at49sn6416(t)-70 operating temperature (case) industrial -40c - 85c v cc power supply 1.65v - 1.95v 13. operating modes mode ce oe we reset v pp (4) ai i/o read v il v il v ih v ih xai d out burst read v il v il v ih v ih xai d out program/erase (3) v il v ih v il v ih v ihpp (5) ai d in standby/program inhibit v ih x (1) xv ih x x high z program inhibit xxv ih v ih x xv il xv ih x xxx x v ilpp (6) output disable x v ih xv ih x high z reset x x x v il x x high z product identification software v ih a0 = v il , a1 - a21 = v il manufacturer code (3) a0 = v ih , a1 - a21 = v il device code (3)
28 3464c?flash?2/05 at49sn6416(t) note: 1. in the erase mode, i cc is 30 ma. 15. input test waveforms and measurement level t r , t f < 5 ns 16. output test load note: 1. this parameter is characterized and is not 100% tested. 14. dc characteristics symbol parameter condition min max units i li input load current v in = 0v to v cc 1a i lo output leakage current v i/o = 0v to v cc 1a i sb1 v cc standby current cmos ce = v ccq - 0.3v to v cc 35 a i cc (1) v cc active current f = 66 mhz; i out = 0 ma 30 ma i ccre v cc read while erase current f = 66 mhz; i out = 0 ma 50 ma i ccrw v cc read while write current f = 66 mhz; i out = 0 ma 50 ma v il input low voltage 0.4 v v ih input high voltage v ccq - 0.2 v v ol output low voltage i ol = 100 a i ol = 2.1 ma 0.1 0.25 v v oh output high voltage i oh = -100 a v ccq - 0.1 v i oh = -400 a 1.4 ac driving levels 1.4v 0.4v 0.9v ac measurement level v 1.8k output pin 30 pf 1.3k ccq 17. pin capacitance f = 1 mhz, t = 25c (1) typ max units conditions c in 46 pf v in = 0v c out 812 pf v out = 0v
29 3464c?flash?2/05 at49sn6416(t) 19. avd pulsed asynchronous read cycle waveform (1)(2) notes: 1. after the high-to-low transition on avd , avd may remain low as long as the address is stable. 2. clk may be static high or static low. 20. asynchronous read cycle waveform (1)(2)(3)(4) notes: 1. ce may be delayed up to t acc - t ce after the address transition without impact on t acc . 2. oe may be delayed up to t ce - t oe after the falling edge of ce without impact on t ce or by t acc - t oe after an address change without impact on t acc . 3. t df is specified from oe or ce , whichever occurs first (cl = 5 pf). 4. avd and clk should be tied low. 18. ac asynchronous read timing characteristics symbol parameter min max units t acc1 access, avd to data valid 70 ns t acc2 access, address to data valid 70 ns t ce access, ce to data valid 70 ns t oe oe to data valid 20 ns t ahav address hold from avd 9ns t avlp avd low pulse width 10 ns t avhp avd high pulse width 10 ns t aav address valid to avd 10 ns t df ce , oe high to data float 25 ns t oh output hold from oe , ce or address, whichever occurred first 0 ns t ro reset to output delay 150 ns t ce t acc2 t df t df t ahav data va l i d ce i/o0-i/o15 a2 -a21 t aav t avlp t acc1 avd oe t oe t avhp reset t ro (1) t acc2 t ahav a0 -a1 t aav output valid i/o0 - i/o15 high z reset oe t oe t ce address valid t df t oh t acc2 t ro ce a0 - a21 t rc
30 3464c?flash?2/05 at49sn6416(t) 22. page read cycle waveform 1 (1) note: 1. after the high-to-low transition on avd , avd may remain low as long as the page address is stable. 23. page read cycle waveform 2 (1) note: 1. avd may remain low as long as the page address is stable. 21. ac asynchronous read timing characteristics symbol parameter min max units t acc1 access, avd to data valid 70 ns t acc2 access, address to data valid 70 ns t ce access, ce to data valid 70 ns t oe oe to data valid 20 ns t ahav address hold from avd 9ns t avlp avd low pulse width 10 ns t avhp avd high pulse width 10 ns t aav address valid to avd 10 ns t df ce , oe high to data float 25 ns t ro reset to output delay 150 ns t pa a page address access time 20 ns t ce t acc2 t df t df t ahav data valid ce i/o0-i/o15 a2 -a21 t aav t avlp t acc1 avd oe t oe t avhp reset t ro (1) t acc2 t ahav a0 -a1 t aav t pa a t ce t acc2 t df t df data va l i d ce i/o0-i/o15 a2 -a21 avd oe t oe reset t ro (1) t acc2 a0 -a1 t pa a v il
31 3464c?flash?2/05 at49sn6416(t) 25. burst read cycle waveform notes: 1. the wait signal (dashed line) shown is for a burst configuration register setting of b10 and b8 = 0. the wait signal (s olid line) shown is for a burst configuration setting of b10 = 1 and b8 = 0. 2. after the high-to-low transition on avd , avd may remain low. 24. ac burst read timing characteristics symbol parameter min max units t clk clk period 15 ns t ckh clk high time 4 ns t ckl clk low time 4 ns t ckrt clk rise time 3.5 ns t ckft clk fall time 3.5 ns t ack address valid to clock 7 ns t avck avd low to clock 7 ns t ceck ce low to clock 7 ns t ckav clock to avd high 3 ns t qhck output hold from clock 3 ns t ahck address hold from clock 8 ns t ckry clock to wait delay 13 ns t cesav ce setup to avd 10 ns t aav address valid to avd 10 ns t ahav address hold from avd 9ns t ckqv clk to data delay 13 ns t ceqz ce high to output high-z 10 ns d3 d15 d4 d16 ce i/o0-i/o15 a0-a21 avd clk oe t clk t ckh t ckl ... wait t cesav t ce t ahav t aav d17 ... d14 ... t ceck t ahck t avck t ack t ckry t ckry ... t ckav t ckqv t ceqz t qhck (1) (2)
32 3464c?flash?2/05 at49sn6416(t) 26. burst read waveform (clock latency of 4) note: 1. dashed line reflects a b10 and b8 setting of 0 in the configuration register. solid line reflects a b10 setting of 0 and b8 setting of 1 in the configuration register. 27. hold data for 2 clock cycles read waveform (clock latency of 4) note: 1. the dashed line reflects a burst configuration register setting of b10 and b8 = 0, b9 = 1. solid line reflects a burst c onfigura- tion register setting of b10 = 0, b8 and b9 = 1. valid d11 d13 d14 d15 d12 ce a0-a21 i/o0-i/o15 avd clk oe wait (1) a c d e f g b high z high z d16 d18 d17 a0-a21 i/o0-i/o15 avd clk wait (1) oe ce d9 d10 d11 d12 d13 d14 d15 d16 a9
33 3464c?flash?2/05 at49sn6416(t) 28. four-word burst read waveform (clock latency of 4) note: 1. the wait signal shown is for a burst configuration register of b10 and b8 = 1. 29. burst suspend waveform notes: 1. the wait signal (dashed line) shown is for a burst configuration register setting of b10 and b8 = 0. the wait signal (s olid line) shown is for a burst configuration setting of b10 = 1 and b8 = 0. 2. during burst suspend, clk signal can be held low or high. ce a0-a21 i/o0-i/o15 avd clk oe valid a c b wait (1) high z high z d0 d2 d3 d1 d0 d1 d2 d1 ce i/o0-i/o15 a0-a21 avd clk oe t clk t ckh t ckl ... wait t ceav t ce t ahav t aav t ceck t ahck t avck t ack t ckav t ckqv t ceqz t qhck t df (2) (2) t oe
34 3464c?flash?2/05 at49sn6416(t) 31. ac word load waveforms 1 31.1 we controlled (1) note: 1. after the high-to-low transition on avd , avd may remain low as long as the clk input does not toggle. 31.2 ce controlled (1) note: 1. after the high-to-low transition on avd , avd may remain low as long as the clk input does not toggle. 30. ac word load characteristics 1 symbol parameter min max units t aav address valid to avd high 10 ns t ahav address hold time from avd high 9 ns t avlp avd low pulse width 10 ns t ds data setup time 50 ns t dh data hold time 0 ns t cesav ce setup to avd 10 ns t wp ce or we low pulse width 35 ns t wph ce or we high pulse width 25 ns t weav we high time to avd low 25 ns t ceav ce high time to avd low 25 ns t ds t weav t dh t aav t ahav t avlp t wp data valid ce i/o0-i/o15 a0 -a21 avd we t ds t dh t ahav t avlp t wp data valid ce i/o0-i/o15 a0 -a21 avd we t cesav t ceav t aav
35 3464c?flash?2/05 at49sn6416(t) 33. ac word load waveforms 2 33.1 we controlled (1) note: 1. the clk input should not toggle. 33.2 ce controlled (1) note: 1. the clk input should not toggle. 32. ac word load characteristics 2 symbol parameter min max units t as address setup time to we and ce high 50 ns t ah address hold time 0 ns t ds data setup time 50 ns t dh data hold time 0 ns t wp ce or we low pulse width 35 ns t wph ce or we high pulse width 25 ns i/o0 - i/o15 a0 - a21 we ce avd v il data valid i/o0 - i/o15 a0 - a21 ce avd v il data valid we
36 3464c?flash?2/05 at49sn6416(t) 35. program cycle waveforms 36. sector, plane or chip erase cycle waveforms notes: 1. any address can be used to load data. 2. oe must be high only when we and ce are both low. 3. the data can be 40h or 10h. 4. for chip erase, any address can be used. for plane erase or sector erase, the address depends on what plane or sector is to be erased. 5. for chip erase, the data should be 21h, for plane erase, the data should be 22h, and for sector erase, the data should be 20h. 34. program cycle characteristics symbol parameter min typ max units t bp word programming time 22 s t wc write cycle time t sec1 sector erase cycle time (4k word sectors) 200 ms t sec2 sector erase cycle time (32k word sectors) 700 ms t es erase suspend time 15 s t ps program suspend time 10 s t eres delay between erase resume and erase suspend 500 s oe program cycle input data note 3 address t bp t wp ce we avd a0 - a21 i/o0 - i/o15 t wph t as t ah t dh t ds t wc xx (1) v il oe (2) d0 xx (1) word 0 word 1 note 4 t wph t wp ce we a0 - a21 t as t ah t sec1/2 t dh t ds t wc avd i/o0 - i/o15 v il note 5
37 3464c?flash?2/05 at49sn6416(t) 37. common flash interface definition table address at49sn6416t at49sn6416 comments 10h 0051h 0051h ?q? 11h 0052h 0052h ?r? 12h 0059h 0059h ?y? 13h 0003h 0003h 14h 0000h 0000h 15h 0041h 0041h 16h 0000h 0000h 17h 0000h 0000h 18h 0000h 0000h 19h 0000h 0000h 1ah 0000h 0000h 1bh 0016h 0016h vcc min write/erase 1ch 0019h 0019h vcc max write/erase 1dh 00b5h 0009h vpp min voltage 1eh 00c5h 000ah vpp max voltage 1fh 0004h 0004h typ word write ? 16 s 20h 0000h 0000h 21h 0009h 0009h typ block erase ? 500 ms 22h 0010h 0010h typ chip erase ? 64,300 ms 23h 0004h 0004h max word write/typ time 24h 0000h 0000h n/a 25h 0003h 0003h max block erase/typ block erase 26h 0003h 0003h max chip erase/ typ chip erase 27h 0017h 0017h device size 28h 0001h 0001h x16 device 29h 0000h 0000h x16 device 2ah 0000h 0000h multiple byte write not supported 2bh 0000h 0000h multiple byte write not supported 2ch 0002h 0002h 2 regions, x = 2 2dh 007eh 0007h 64k bytes, y = 126 (top); 8k bytes, y = 7 (bottom) 2eh 0000h 0000h 64k bytes, y = 126 (top); 8k bytes, y = 7 (bottom) 2fh 0000h 0020h 64k bytes, z = 256 (top); 8k bytes, z = 32 (bottom) 30h 0001h 0000h 64k bytes, z = 256 (top); 8k bytes, z = 32 (bottom) 31h 0007h 007eh 8k bytes, y = 7 (top); 64k bytes, y = 126 (bottom) 32h 0000h 0000h 8k bytes, y = 7 (top); 64k bytes, y = 126 (bottom) 33h 0020h 0000h 8k bytes, z = 32 (top);64k bytes, z = 256 (bottom) 34h 0000h 0001h 8k bytes, z = 32 (top);64k bytes, z = 256 (bottom)
38 3464c?flash?2/05 at49sn6416(t) vendor specific extended query 41h 0050h 0050h ?p? 42h 0052h 0052h ?r? 43h 0049h 0049h ?i? 44h 0031h 0031h major version number, ascii 45h 0030h 0030h minor version number, ascii 46h 00bfh 00bfh bit 0 ? chip erase supported, 0 ? no, 1 ? yes bit 1 ? erase suspend supported, 0 ? no, 1 ? yes bit 2 ? program suspend supported, 0 ? no, 1 ? yes bit 3 ? simultaneous operations supported, 0 ? no, 1 ? yes bit 4 ? burst mode read supported, 0 ? no, 1 ? yes bit 5 ? page mode read supported, 0 ? no, 1 ? yes bit 6 ? queued erase supported, 0 ? no, 1 ? yes bit 7 ? protection bits supported, 0 ? no, 1 ? yes 47h 0000h 0001h bit 0 ? top (?0?) or bottom (?1?) boot block device undefined bits are ?0? 48h 000fh 000fh bit 0 ? 4 word linear burst with wrap around, 0 ? no, 1 ? yes bit 1 ? 8 word linear burst with wrap around, 0 ? no, 1 ? yes bit 2 ? 16 word linear burst with wrap around, 0 ? no, 1 ? yes bit 3 ? continuous burst, 0 ? no, 1 ? yes undefined bits are ?0? 49h 0001h 0001h bit 0 ? 4 word page, 0 ? no, 1 ? yes bit 1 ? 8 word page, 0 ? no, 1 ? yes undefined bits are ?0? 4ah 0080h 0080h location of protection register lock byte, the section?s first byte 4bh 0003h 0003h # of bytes in the factory prog section of prot register ? 2*n 4ch 0003h 0003h # of bytes in the user prog section of prot register ? 2*n 37. common flash interface definition table (continued) address at49sn6416t at49sn6416 comments
39 3464c?flash?2/05 at49sn6416(t) 38. ordering information 38.1 standard package t acc (ns) i cc (ma) ordering code package operation range active standby 70 30 0.035 at49sn6416-70ci 56c2 industrial (-40 to 85 c) 70 30 0.035 at49sn6416t-70ci 56c2 industrial (-40 to 85 c) package type 56c2 56-ball, plastic chip-size ball grid array package (cbga)
40 3464c?flash?2/05 at49sn6416(t) 39. packaging information 39.1 56c2 ? cbga 2325 orchard parkway san jose, ca 95131 title drawing no. r rev. 56c2 , 56-ball (8 x 7 array), 7 x 10 x 1.0 mm body, 0.75 mm ball pitch ceramic ball grid array package (cbga) a 56c2 1/9/04 0.12 c seating plane c 0.875 mm ref d e top view side view a 87 6 5 4 3 21 ?b 2.75 mm ref bottom view a a1 d1 e1 e e b c d e f g common dimensions (unit of measure = mm) symbol min nom max note a ? ? 1.00 a1 0.21 ? ? d 6.90 7.00 7.10 d1 5.25 typ e 9.90 10.00 10.10 e1 4.50 typ e 0.75 typ ? b 0.35 typ
41 3464c?flash?2/05 at49sn6416(t) 40. revision history revision no. history revision a ? march 2004 ? initial release revision b ? april 2004 ? timing diagrams on pages 31 , 32 , and 33 were changed such that the default state is now shown as a solid line (shown as dashed line before). ? added a note in the ?burst configuration register table? regarding the usee of clock latency of two. ? wrap option removed on pages 3 , 21 and 22 . revision c ? january 2005 ? converted datasheet to new template. ? removed ?preliminary? from the datasheet. ? changed the v pp value to 9.5v + 0.5v in the text, table on page 19 , and cfi table. v pp text also changed to show that a high voltage on v pp improves only the programming time. ? changed the i sb1 spec to 35 a. ? modified note 11 and added note 12 on page 19 . ? modified note 1 and added note 2 on page 20 . ? modified the b15 section in the ?burst configuration register table? on page 21
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